WAFER PROFILER CVP21
The Wafer Profiler CVP21 is a handy tool to measure
doping profiles in semiconductor layers
by Electrochemical Capacitance Voltage Profiling (ECV Profiling, CV
Profiling) in semiconductor research or production.
This ECV Profiler (CV-Profiler, C-V Profiler) furthermore is a very good choice to analyze or develop
strategies for Photo-Electrochemical Wet Etching (PEC Etching) of
semiconductors.
|
CVP21
with footprint 60(W)*80(D)*195(H)cm, |
CVP21 is the COMPLETE SOLUTION:
CVP21 supports the COMPLETE spectrum of materials:
CVP21 supports the COMPLETE sample range:
CVP21 supports the COMPLETE resolution range:
(*) may depend on material type/ sample quality. Please ask for sample measurements
CVP21 comes as a COMPLETE measurement system:
|
|
CVP21
as a table-top unit |
CVP21 can be delivered:
CVP21 installation requirements:
|
The
benefit list compares our equipment CVP21 to other ECV equipment.
Patents:
DE-10256821, US-7026255 (further pending).
|
Application requirements: |
Our solutions: |
|
Production applications |
Easy, clear and automatic operation |
|
Research applications |
High flexibility of the configuration recipes |
|
Long process times |
Very high reliability |
|
Huge data streams |
Clear and reliable data storage and backup |
This equipment is distributed throughout Europe by Dage Electronic Europa-Vertriebs GmbH.
Further information: PDF Flyer (270kB) [Japanese Version]